Improving accuracy of on-chip diagnosis via incremental learning-Reference-Cited by-同舟云学术

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Improving accuracy of on-chip diagnosis via incremental learning

Published:2015-04 Issue: Volume: Page:
ISSN:
Container-title:2015 IEEE 33rd VLSI Test Symposium (VTS)
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Author:

Ren Xuanle,Martin Mitchell,Blanton R. D.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7104933/7116233/07116280.pdf?arnumber=7116280

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Predicting the Resolution of Scan Diagnosis;2023 IEEE International Test Conference (ITC);2023-10-07

2. A new hybrid incremental learning system for an enhanced KNN algorithm (hoKNN);Evolving Systems;2023-08-06

3. Machine Learning in Logic Circuit Diagnosis;Machine Learning Support for Fault Diagnosis of System-on-Chip;2022-10-22

4. Comparison of Free and Open PPP Services for Master-base Positioning in Geodetic Disadvantaged Areas: Case Study along the Sirba River in Sub-Saharan Africa;Proceedings of the 8th International Conference on Geographical Information Systems Theory, Applications and Management;2022

5. A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer Returns;2020 IEEE International Test Conference (ITC);2020-11-01

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