Application of Residue Sampling to RF/AMS Device Testing-Reference-Cited by-同舟云学术

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Application of Residue Sampling to RF/AMS Device Testing

Published:2021-11 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE 30th Asian Test Symposium (ATS)
language:
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Author:

Katayama Shogo,Abe Yudai,Kuwana Anna,Asami Koji,Ishida Masahiro,Ohta Ryuya,Kobayashi Haruo

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9667777/9668201/09668259.pdf?arnumber=9668259

Reference14 articles.

1. Bluetooth Core Specification Version 5.2;BR/EDR Controller,2019

2. Analysis and Design of Multi-Tone Signal Generation Algorithms for Reducing Crest Factor

3. Test time efficient group delay filter characterization technique using a discrete chirped excitation signal

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Challenges for Waveform Sampling and Related Technologies;2022 IEEE 16th International Conference on Solid-State & Integrated Circuit Technology (ICSICT);2022-10-25

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