An Improved YOLOv8 Network for Photosensitive Element Defect Detection-Reference-Cited by-同舟云学术

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An Improved YOLOv8 Network for Photosensitive Element Defect Detection

Published:2023-08-18 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE 6th International Conference on Pattern Recognition and Artificial Intelligence (PRAI)
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Author:

Ye Wenjin¹,Yue Hongwei²,Kou Kit Ian³,Gao Hongchao⁴,Yu Mingqi¹,Chen Chuangquan¹

Affiliation:

1. Wuyi University,Faculty of Intelligent Manufacturing,Jiangmen,Guangdong,China,529020

2. Guangdong University of Education,School of Physics and Information Engineering,Guangzhou,Guangdong,China,510303

3. University of Macau,Faculty of Science and Technology,Macau,Macau,China,51900

4. OPT Machine Vision Tech Co.,Dongguan,Guangdong,China,523850

Funder

Research and Development

Technology Development

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10330801/10331922/10331951.pdf?arnumber=10331951

Reference35 articles.

1. Research of camera module sensor dead pixel detection

2. You Only Look Once: Unified, Real-Time Object Detection

3. YOLO9000: Better, Faster, Stronger

4. Yolov3: An incremental improvement;Redmon,2018

5. CBAM: Convolutional Block Attention Module

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