A summary of SEU test results using Californium-252-Reference-Cited by-同舟云学术

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A summary of SEU test results using Californium-252

Published:1988 Issue:6 Volume:35 Page:1622-1628
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Harboe-Sorensen R.,Adams L.,Sanderson T.K.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx1/23/964/00025509.pdf?arnumber=25509

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 40 Years of Radiation Single Event Effects at the European Space Agency, ESTEC;IEEE Transactions on Nuclear Science;2013-06

2. Heavy ion induced single event effects in semiconductor device;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-02

3. Estimation of the LET threshold of single event upset of microelectronics in experiments with Cf-252;Radiation Measurements;1996-05

4. Using heavy-ion radiation to validate fault-handling mechanisms;IEEE Micro;1994-02

5. Test methods for single event upset/latch-up;Radiation Physics and Chemistry;1994-01

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