Author:
Raman Ajay,Jain Vibhor,Veeramani Elanchezhian,Lim Beng Woon,Raghunathan Uppili S.,Ngu Yves,Joseph Alvin
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Simulation of DC Safe Operating Area and RF Breakdown in SiGe PA HBT;2023 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2023-10-16
2. Impact of Layout Parasitics and Thermal Coupling on PA performance and ruggedness in SiGe HBTs;2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2022-10-16