Author:
Muriel S.,Garcia P.,Maire-Richard O.,Monleon M.,Recio M.
Cited by
4 articles.
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2. An Ensembled Anomaly Detector for Wafer Fault Detection;Sensors;2021-08-13
3. Application of an Ordinal Optimization Algorithm to the Wafer Testing Process;IEEE Transactions on Systems, Man, and Cybernetics - Part A: Systems and Humans;2006-11
4. Reducing the overkills and retests in wafer testing process;Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI