Author:
Tafertshofer ,Ganz ,Henftling
Cited by
28 articles.
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3. Special Session – Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits;2021 IEEE 39th VLSI Test Symposium (VTS);2021-04-25
4. Chapter 27. Non-Clausal SAT and ATPG;Frontiers in Artificial Intelligence and Applications;2021-02-02
5. Modelling and Verification of User Interactions Using Constraint Programming;2017 IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C);2017-07