Path-RO: A novel on-chip critical path delay measurement under process variations

Author:

Wang Xiaoxiao,Tehranipoor Mohammad,Datta Ramyanshu

Publisher

IEEE

Cited by 45 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Performance Screening Using Functional Path Ring Oscillators;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-06

2. New Approaches of Side-Channel Attacks Based on Chip Testing Methods;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-05

3. Fault-Tolerant Circuits;Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design;2023

4. On Correction of A Delay Value Using Ring-Oscillators for Aging Detection and Prediction;2022 IEEE 31st Asian Test Symposium (ATS);2022-11

5. A Path Selection Flow for Functional Path Ring Oscillators using Physical Design Data;2022 IEEE International Test Conference (ITC);2022-09

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