Complex permittivity characterization through differential waveguide group delay measurement
Author:
Affiliation:
1. University of Pretoria Pretoria,Dept. EEC Engineering,South Africa
Funder
National Research Foundation
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10145926/10146047/10146091.pdf?arnumber=10146091
Reference12 articles.
1. Transmission lines characteristic impedance versus Q-factor in CMOS technology
2. A Method for Extracting an Apparent Permittivity from Band Limited Measurements of Homogeneously Filled Transmission Lines
3. Noniterative stable transmission/reflection method for low-loss material complex permittivity determination
4. Time domain characterization of lossy arbitrary characteristic impedance transmission lines
5. SLA-Printed K-Band Waveguide Components Using Tollens Reaction Silver Plating
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