Fabrication and Characterization of Sidewall Defined Silicon-on-Insulator Single-Electron Transistor-Reference-Cited by-同舟云学术

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Fabrication and Characterization of Sidewall Defined Silicon-on-Insulator Single-Electron Transistor

Published:2008-09 Issue:5 Volume:7 Page:544-550
ISSN:1536-125X
Container-title:IEEE Transactions on Nanotechnology
language:
Short-container-title:IEEE Trans. Nanotechnology

Author:

Young Chai Jung ,Keun Hwi Cho ,Byoung Hak Hong ,Seung Hun Son ,Duk Soo Kim ,Dongmok Whang ,Sung Woo Hwang ,Yun Seop Yu ,Ahn D.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications

Link

http://xplorestaging.ieee.org/ielx5/7729/4636867/04539995.pdf?arnumber=4539995

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of Oxidation-Induced Tensile Strain on Gate-All-Around Silicon-Nanowire-Based Single-Electron Transistor Fabricated Using Deep-UV Lithography;IEEE Transactions on Nanotechnology;2011-11

2. Comparative Study on Energy-Efficiencies of Single-Electron Transistor-Based Binary Full Adders Including Nonideal Effects;IEEE Transactions on Nanotechnology;2011-09

3. Room-Temperature Operation of Silicon Single-Electron Transistor Fabricated Using Optical Lithography;IEEE Transactions on Nanotechnology;2011-01

4. Ultra-energy-efficient analog-to-digital converters based on single-electron transistor/CMOS hybrid technology for biomedical applications;Semiconductor Science and Technology;2009-10-09

5. Comparative study on the energy efficiency of logic gates based on single-electron transistor technology;SEMICOND SCI TECH;2009

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