Lot-to-Lot Variability and TID degradation of Bipolar Transistors Analyzed with ESA and PRECEDER Databases-Reference-Cited by-同舟云学术

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Lot-to-Lot Variability and TID degradation of Bipolar Transistors Analyzed with ESA and PRECEDER Databases

Published:2023-07 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE Space Computing Conference (SCC)
language:
Short-container-title:

Author:

Martín-Holgado Pedro¹,Romero-Maestre Amor¹,de-Martín-Hernández José²,Krimmel Florian³,Borel Thomas³,Muschitiello Michele³,Costantino Alessandra³,Tonicello Ferdinando³,Poivey Christian³,Pesce Anastasia³,Ramos Olga²,Domínguez Manuel²,Morilla Yolanda¹

Affiliation:

1. Centro Nacional de Aceleradores (US, JA, CSIC),Seville,Spain

2. Alter Technology,Seville,Spain

3. European Space Agency,Noordwijk,The Netherlands

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10207170/10207189/10207293.pdf?arnumber=10207293

Reference20 articles.

1. Basic Specification No. 22900, Total Dose Steady-State Irradiation Test Method;Tech Rep,2016

2. Lot-to-lot variability TID effects on COTS BJT;krimmel;RADECS,2021

3. Method 1019 Steady-State Total Dose Irradiation Procedure, MIL-STD-750, Test method standard for semiconductor devices;Tech Rep,2016

4. ECSS-E-HB-10-12A. Calculation of radiation and its effects and margin policy handbook;Tech Rep,2010

5. On relative dispersion: A new solution for some old problems

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