Lot-to-Lot Variability and TID degradation of Bipolar Transistors Analyzed with ESA and PRECEDER Databases
Author:
Affiliation:
1. Centro Nacional de Aceleradores (US, JA, CSIC),Seville,Spain
2. Alter Technology,Seville,Spain
3. European Space Agency,Noordwijk,The Netherlands
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10207170/10207189/10207293.pdf?arnumber=10207293
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4. ECSS-E-HB-10-12A. Calculation of radiation and its effects and margin policy handbook;Tech Rep,2010
5. On relative dispersion: A new solution for some old problems
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