The Perils and Pitfalls of Block Design for EEG Classification Experiments-Reference-Cited by-同舟云学术

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The Perils and Pitfalls of Block Design for EEG Classification Experiments

Published:2020 Issue: Volume: Page:1-1
ISSN:0162-8828
Container-title:IEEE Transactions on Pattern Analysis and Machine Intelligence
language:
Short-container-title:IEEE Trans. Pattern Anal. Mach. Intell.

Author:

Li Ren^ORCID,Johansen Jared S.^ORCID,Ahmed Hamad^ORCID,Ilyevsky Thomas V.^ORCID,Wilbur Ronnie B.,Bharadwaj Hari M.^ORCID,Siskind Jeffrey Mark^ORCID

Funder

Siemens USA

Intelligence Advanced Research Projects Activity

Directorate for Computer and Information Science and Engineering

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Applied Mathematics,Artificial Intelligence,Computational Theory and Mathematics,Computer Vision and Pattern Recognition,Software

Link

http://xplorestaging.ieee.org/ielx7/34/4359286/09264220.pdf?arnumber=9264220

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