Efficient Learning of Image Super-Resolution and Compression Artifact Removal with Semi-Local Gaussian Processes

Author:

Kwon Younghee,Kim Kwang In,Tompkin James,Kim Jin Hyung,Theobalt Christian

Funder

NSF

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Applied Mathematics,Artificial Intelligence,Computational Theory and Mathematics,Computer Vision and Pattern Recognition,Software

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3. A Gaussian process regression-based Noise level Prediction technique for assisting Image Super-resolution;Proceedings of 7th ASRES International Conference on Intelligent Technologies;2023

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