A Comprehensive Database for Benchmarking Imaging Systems-Reference-Cited by-同舟云学术

A Comprehensive Database for Benchmarking Imaging Systems

Published:2020-03-01 Issue:3 Volume:42 Page:509-520
ISSN:0162-8828
Container-title:IEEE Transactions on Pattern Analysis and Machine Intelligence
language:
Short-container-title:IEEE Trans. Pattern Anal. Mach. Intell.

Author:

Panetta Karen,Wan Qianwen^ORCID,Agaian Sos^ORCID,Rajeev Srijith^ORCID,Kamath Shreyas^ORCID,Rajendran Rahul,Rao Shishir Paramathma,Kaszowska Aleksandra^ORCID,Taylor Holly A.,Samani Arash^ORCID,Yuan Xin

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Applied Mathematics,Artificial Intelligence,Computational Theory and Mathematics,Computer Vision and Pattern Recognition,Software

Link

http://xplorestaging.ieee.org/ielx7/34/8984605/08554155.pdf?arnumber=8554155

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