Analysis and optimization of erasing waveform in phase change memory arrays
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/5307512/5331301/05331471.pdf?arnumber=5331471
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Phase Change and Magnetic Memories for Solid-State Drive Applications;Proceedings of the IEEE;2017-09
2. Exposing Reliability/Performance Tradeoff in Non-Volatile Memories Through Erratic Bits Signature Classification;IEEE Transactions on Device and Materials Reliability;2014-03
3. Statistical Modeling of Secondary Path During Erase Operation in Phase Change Memories;IEEE Transactions on Electron Devices;2012-03
4. Empirical investigation of SET seasoning effects in Phase Change Memory arrays;Solid-State Electronics;2011-04
5. Nonvolatile Memory Partitioning Scheme for Technology-Based Performance-Reliability Tradeoff;IEEE Embedded Systems Letters;2011-03
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