Author:
Jutman Artur,Reorda Matteo Sonza,Wunderlich Hans-Joachim
Cited by
3 articles.
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1. Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test;2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS);2019-04
2. New Techniques to Reduce the Execution Time of Functional Test Programs;IEEE Transactions on Computers;2017-07-01
3. Functional Diagnosis for Graceful Degradation of NoC Switches;2016 IEEE 25th Asian Test Symposium (ATS);2016-11