Author:
Kumar Chandan,Maamari Fadi,Vittal Kiran,Pradeep Wilson,Tiwari Rajesh,Ravi Srivaths
Cited by
4 articles.
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1. Estimation of SoC Testability at Early RTL Stage;Intelligent Manufacturing and Energy Sustainability;2023
2. Developing Benchmarks for Radiation Testing of Microcontroller Arithmetic Units Using ATPG;IEEE Transactions on Nuclear Science;2021-05
3. Representing Gate-Level SET Faults by Multiple SEU Faults at RTL;2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS);2020-07
4. Scalable Fault Coverage Estimation of Sequential Circuits without Fault Injection;2018 IEEE International Symposium on Circuits and Systems (ISCAS);2018