Stress Testing for Resilience of Semiconductor Supply Chains-Reference-Cited by-同舟云学术

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Stress Testing for Resilience of Semiconductor Supply Chains

Published:2023-10-12 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE 14th Annual Ubiquitous Computing, Electronics & Mobile Communication Conference (UEMCON)
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Author:

Collier Zachary A.¹,Loose Davis C.²,Sellers Elvie²,Polmateer Thomas L.³,Behl Madhur²,Linkov Igor⁴,Lambert James H.²

Affiliation:

1. Radford University,Dept. of Management,Radford,VA,USA

2. University of Virginia,Dept. of Systems and Information Engineering,Charlottesville,VA,USA

3. Commonwealth Center for Advanced Logistics Systems,Petersburg,VA,USA

4. University of Florida and US Army Engineer,Research and Development Center,Concord,MA,USA

Funder

National Science Foundation

University of Virginia

Arm

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10315953/10315721/10315988.pdf?arnumber=10315988

Reference52 articles.

1. Past challenges and the future of discrete event simulation

2. Multiscale approach to the security of hardware supply chains for energy systems

3. Systems Modeling and Resilience of Schedule at Maritime Container Ports

4. Improving the rigor of discrete‐event simulation in logistics and supply chain research

5. Resilience, Adaptability and Transformability in Social-ecological Systems

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