Acoustic Microscopy Applied to SAW Dispersion and Film Thickness Measurement-Reference-Cited by-同舟云学术

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Acoustic Microscopy Applied to SAW Dispersion and Film Thickness Measurement

Published:1980-03 Issue:2 Volume:27 Page:82-86
ISSN:0018-9537
Container-title:IEEE Transactions on Sonics and Ultrasonics
language:
Short-container-title:IEEE Trans. Son. Ultrason.

Author:

Weglein R.D.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering

Link

http://xplorestaging.ieee.org/ielx5/10326/32842/01539228.pdf?arnumber=1539228

Cited by 51 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. The Auto-focus Method for Scanning Acoustic Microscopy by Sparse Representation;Sensing and Imaging;2019-07-23

3. 7.11 Ultrasonic Inspection of Composites;Comprehensive Composite Materials II;2018

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