Author:
Hari Siva Kumar Sastry,Adve Sarita V.,Naeimi Helia
Cited by
43 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. In-Field Fault Detection Framework for Edge Accelerator Using Autoencoder;2024 IEEE 8th International Test Conference India (ITC India);2024-07-21
2. Techniques for detecting and masking faults in semantic segmentation applications;Microelectronics Reliability;2024-06
3. Soft Error Resilience at Near-Zero Cost;Proceedings of the 38th ACM International Conference on Supercomputing;2024-05-30
4. Druto: Upper-Bounding Silent Data Corruption Vulnerability in GPU Applications;2024 IEEE International Parallel and Distributed Processing Symposium (IPDPS);2024-05-27
5. Reliability and Security of AI Hardware;2024 IEEE European Test Symposium (ETS);2024-05-20