Scattering Matrix Approach to Electron Transmission Probability Through a Flat Semiconductor / Vacuum Interface-Reference-Cited by-同舟云学术

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Scattering Matrix Approach to Electron Transmission Probability Through a Flat Semiconductor / Vacuum Interface

Published:2024-07-15 Issue: Volume: Page:1-2
ISSN:
Container-title:2024 37th International Vacuum Nanoelectronics Conference (IVNC)
language:
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Author:

Hernandez Nathaniel¹,Cahay Marc¹,Hart James¹,O'Mara Jonathan²,Ludwick Jonathan³,Walker Dennis E.²,Back Tyson⁴,Hall Harris²

Affiliation:

1. University of Cincinnati,Spintronics and Vacuum Nanoelectronics Laboratory,Cincinnati,Ohio,USA

2. Sensors Directorate, Wright-Patterson Air Force Base,Air Force Research Laboratory,USA

3. UES a BlueHalo company,Dayton,Ohio,USA

4. Materials and Manufacturing Directorate, Wright-Patterson Air Force Base,Air Force Research Laboratory,Ohio,USA

Funder

Air Force Office of Scientific Research

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10649892/10652259/10652264.pdf?arnumber=10652264

Reference4 articles.

1. Conductance of an array of elastic scatterers: A scattering-matrix approach

2. Interface connection rules for effective-mass wave functions at an abrupt heterojunction between two different semiconductors

3. Effects of matching conditions in effective-mass theory: Quantum wells, transmission, and metal-induced gap states

4. Space-Charge Effects on Electron Tunneling

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