MOS memory using germanium nanocrystals formed by thermal oxidation of Si/sub 1-x/Ge/sub x/
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IEEE
Cited by 76 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Segregation-induced formation of Ge nanocrystals in silicon oxide;Journal of the Belarusian State University. Physics;2022-06-15
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4. Study and design of resistive switching behaviors in PMMA-based conducting-bridge random-access memory (CBRAM) devices;Microsystem Technologies;2015-12-26
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