Characterizing Temperature, Power, and Soft-Error Behaviors in Data Center Systems: Insights, Challenges, and Opportunities

Author:

Nie Bin,Xue Ji,Gupta Saurabh,Engelmann Christian,Smirni Evgenia,Tiwari Devesh

Publisher

IEEE

Cited by 46 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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