Combining measurements and modeling/simulations analysis to assess carbon nanotube memory cell characteristics
Author:
Affiliation:
1. The Aerospace Corporation,MTD,Los Angeles,CA
2. Nanolayers Research Computing LTD,UK
3. UCL,London,UK
4. Nantero Inc.,Woburn,MA,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9764406/9764408/09764576.pdf?arnumber=9764576
Reference7 articles.
1. Metal-oxide resistive random access memory (RRAM) technology: Material and operation details and ramifications
2. DFTB+, a software package for efficient approximate density functional theory based atomistic simulations
3. Overcoming Limitations in Evaluation of Memristor Technologies for Neural Networks
4. Mitigating switching variability in carbon nanotube memristors
5. An Ultra-fast Multi-level MoTe2-based RRAM
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1. Materials-to-applications evaluation framework: assessing memristor technologies for neural network implementations;2023 IEEE Nanotechnology Materials and Devices Conference (NMDC);2023-10-22
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