GHz C-V Characterization Methodology and Its Application for Understanding Polarization Behaviors in High-k Dielectric Films
Author:
Affiliation:
1. Zhejiang University,College of Information Science & Electronic Engineering,Hangzhou,China
2. Hunan University,College of Electrical and Information Engineering,Changsha,China
Funder
Research and Development
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9764406/9764408/09764436.pdf?arnumber=9764436
Reference15 articles.
1. Rapid and Accurate $C$ – $V$ Measurements
2. Sub-1 ns characterization methodology for transistor electrical parameter extraction
3. A Fast $V_{th}$ Measurement (FVM) Technique for NBTI Behavior Characterization
4. Ultra fast (<1 ns) electrical characterization of self-heating effect and its impact on hot carrier injection in 14nm FinFETs
5. Basics of measuring the dielectric properties of materials;Keysight Technologies,0
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