Author:
Lei Luo,Yinghui Liu,Hongwei Zhang,Xuesong Zheng,Qingkui Yu,Min Tang
Cited by
2 articles.
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1. TCAD Simulation of Single-Event Transient and Hardening in 700V LDMOS Transistors;2022 5th International Conference on Circuits, Systems and Simulation (ICCSS);2022-05-13
2. Application Specific Digital and Mixed-Signal Integrated Circuit Designs Based on Algorithm Hardware Co-Design;2022 First International Conference on Electrical, Electronics, Information and Communication Technologies (ICEEICT);2022-02-16