Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Cited by
8 articles.
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1. Dynamically Adapted Low-Energy Fault Tolerant Processors;2009 NASA/ESA Conference on Adaptive Hardware and Systems;2009-07
2. Design Patterns for Graceful Degradation;Transactions on Pattern Languages of Programming I;2009
3. Towards the Integration of Fault, Resource, and Power Management;Lecture Notes in Computer Science;2004
4. Design of a fault tolerant solid state mass memory;IEEE Transactions on Reliability;2003-12
5. Reliability model of series-parallel systems;Microelectronics Reliability;1994-11