Author:
Chauhan Jayesh D.,Modi Chintan K.,Pithadiya Kunal J.
Cited by
2 articles.
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1. Machine vision based liquid level inspection system using ISEF edge detection technique;Proceedings of the International Conference and Workshop on Emerging Trends in Technology;2010-02-26
2. Location M estimator with optimal edge detector for quality inspection of surface mount device capacitor;Proceedings of the International Conference and Workshop on Emerging Trends in Technology;2010-02-26