Analysis of the Results of Accelerated Aging Tests in Insulated Gate Bipolar Transistors-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Analysis of the Results of Accelerated Aging Tests in Insulated Gate Bipolar Transistors

Published:2016-11 Issue:11 Volume:31 Page:7953-7962
ISSN:0885-8993
Container-title:IEEE Transactions on Power Electronics
language:
Short-container-title:IEEE Trans. Power Electron.

Author:

Astigarraga Daniel,Ibanez Federico Martin,Galarza Ainhoa,Echeverria Jose Martin,Unanue Inigo,Baraldi Piero,Zio Enrico

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/63/7499899/07368210.pdf?arnumber=7368210

Cited by 57 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Life prediction of IGBT module for nuclear power plant rod position indicating and rod control system based on SDAE-LSTM;Nuclear Engineering and Technology;2024-09

2. A multi-source data fusion driven power field effect transistor health state assessment and remaining useful life prediction method;Measurement Science and Technology;2024-08-27

3. IoT-Based IGBT Power Module Health Monitoring System With RUL Estimation for Electric Drive Applications;IEEE Access;2024

4. A remaining useful life prediction method of SiC MOSFET considering failure threshold uncertainty;IET Power Electronics;2023-11-20

5. A Test Rig for Thermal Analysis of Heat Sinks for Power Electronic Applications;2023 IEEE East-West Design & Test Symposium (EWDTS);2023-09-22

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP