Analysis of the Results of Accelerated Aging Tests in Insulated Gate Bipolar Transistors-Reference-Cited by-同舟云学术

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Analysis of the Results of Accelerated Aging Tests in Insulated Gate Bipolar Transistors

Published:2016-11 Issue:11 Volume:31 Page:7953-7962
ISSN:0885-8993
Container-title:IEEE Transactions on Power Electronics
language:
Short-container-title:IEEE Trans. Power Electron.

Author:

Astigarraga Daniel,Ibanez Federico Martin,Galarza Ainhoa,Echeverria Jose Martin,Unanue Inigo,Baraldi Piero,Zio Enrico

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/63/7499899/07368210.pdf?arnumber=7368210

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