1. A simple through-only de-embedding method for on-wafer s-parameter measurements up to 110 ghz;ito;2008 IEEE MTT-S International Microwave Symposium Digest,2008
2. Modeling of a Bulk Current Injection Setup for Susceptibility Threshold Measurements
3. Circuit modeling of the test setup for pulsed current injection;cui;2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC),2016
4. Electromagnetic compatibility (emc), part 4-25: Testing and measurement techniques hemp immunity test methods for equipment and systems,2012
5. Electromagnetic compatibility (EMC) - part 2-10: Environment - description of hemp environment - conducted disturbance,1998