An IGBT Device Health Status Assessment Method Considering the Influence of Operating Conditions-Reference-Cited by-同舟云学术

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An IGBT Device Health Status Assessment Method Considering the Influence of Operating Conditions

Published:2023-07-07 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE/IAS Industrial and Commercial Power System Asia (I&CPS Asia)
language:
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Author:

Yang Cheng¹,Duan Zeyu¹,Yao Ran¹,Li Hui¹,Lai Wei¹,Min Yuan²,Yuan Yannan²,Han Wenxing²

Affiliation:

1. Chongqing University,State Key Laboratory of Power Transmission Equipment & System Security and New Technology,Chongqing,China

2. Nuclear Power Institute of China,Science and Technology on Reactor System Design Technology Laboratory,ChengDu,China

Funder

National Science Foundation of China

China Postdoctoral Science Foundation

Natural Science Foundation of Chongqing, China

Fundamental Research Funds for the Central Universities

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10294329/10294332/10294902.pdf?arnumber=10294902

Reference13 articles.

1. ANFIS: adaptive-network-based fuzzy inference system

2. A Novel IGBT Health Evaluation Method Based on Multi-Label Classification

3. Nonparametric Model-Based Online Junction Temperature and State-of-Health Estimation for Insulated Gate Bipolar Transistors

4. Finite Element Modeling of IGBT Modules to Explore the Correlation between Electric Parameters and Damage in Bond Wires

5. Study on Thermal cycle and Insulation Characteristics of High Reliable IGBT Module

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