NBTI-aware statistical timing analysis framework-Reference-Cited by-同舟云学术

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NBTI-aware statistical timing analysis framework

Published:2010-09 Issue: Volume: Page:
ISSN:
Container-title:23rd IEEE International SOC Conference
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Author:

Han Sangwoo,Kim Juho

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5755492/5784634/05784734.pdf?arnumber=5784734

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Learning-Based Method for Gate Delay Prediction under NBTI and Process Variation Effects;2023 International Symposium of Electronics Design Automation (ISEDA);2023-05-08

2. GPR-Based Framework for Statistical Analysis of Gate Delay under NBTI and Process Variation Effects;Electronics;2022-04-22

3. Asymmetric aging effect on modern microprocessors;Microelectronics Reliability;2021-04

4. Lifetime Reliability Improvement of Nano-Scale Digital Circuits Using Dual Threshold Voltage Assignment;IEEE Access;2021

5. Potential Critical Path Selection Based on a Time-Varying Statistical Timing Analysis Framework;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2019-06

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