Author:
Mondal Shouvick,Silva Denini,d'Amorim Marcelo
Cited by
2 articles.
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1. Test flakiness’ causes, detection, impact and responses: A multivocal review;Journal of Systems and Software;2023-12
2. NeuDep: neural binary memory dependence analysis;Proceedings of the 30th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering;2022-11-07