Field Programmable Analog Array (FPAA) based control of an Atomic Force Microscope
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/4547420/4586444/04586899.pdf?arnumber=4586899
Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Decoupled tracking and damping control of piezo-actuated nanopositioner enabled by multimode charge sensing;Mechanical Systems and Signal Processing;2022-07
2. Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy;Review of Scientific Instruments;2017-12
3. A Wavelet-Based AFM Fast Imaging Method With Self-Tuning Scanning Frequency;IEEE Transactions on Nanotechnology;2017-11
4. A Mini Review of the Key Components used for the Development of High-Speed Atomic Force Microscopy;Science of Advanced Materials;2017-01-01
5. Design of a high-bandwidth tripod scanner for high speed atomic force microscopy;Scanning;2016-08-02
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