Author:
Askar Ramez,Chung Jaehoon,John Laurenz,Merkle Thomas,Wittig Sven,Schmieder Mathis,Suh Yonghak,Lee Jongpil,Baumann Benjamin,Peter Michael,Haustein Thomas,Keusgen Wilhelm,Stanczak Slawomir
Publisher
Institute of Electrical and Electronics Engineers (IEEE)