Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
23 articles.
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1. A Formal Explainer for Just-In-Time Defect Predictions;ACM Transactions on Software Engineering and Methodology;2024-08-26
2. The impact of concept drift and data leakage on log level prediction models;Empirical Software Engineering;2024-07-25
3. Mining Action Rules for Defect Reduction Planning;Proceedings of the ACM on Software Engineering;2024-07-12
4. Practitioners’ Challenges and Perceptions of CI Build Failure Predictions at Atlassian;Companion Proceedings of the 32nd ACM International Conference on the Foundations of Software Engineering;2024-07-10
5. On the Reliability and Explainability of Language Models for Program Generation;ACM Transactions on Software Engineering and Methodology;2024-06-03