Unveiling the Vulnerability of Oxide-Breakdown-Based PUF
Author:
Affiliation:
1. imec, Leuven, Belgium
2. Computer Security and Industrial Cryptography (COSIC) Research Group, KU Leuven, Leuven, Belgium
Funder
Cyber Security Research Flanders
European Commission through Horizon Europe
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Link
http://xplorestaging.ieee.org/ielx7/55/10509537/10445170.pdf?arnumber=10445170
Reference15 articles.
1. Physical unclonable functions
2. Memory-Based Combination PUFs for Device Authentication in Embedded Systems
3. Physical Unclonable Functions and Applications: A Tutorial
4. Reliability enhancement of bi-stable PUFs in 65nm bulk CMOS
5. A reliable PUF in a dual function SRAM
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