Author:
Allenspach Mark,Peters Michael K.,Bird John M.,Fullem Travis Z.,Tostanoski Michael J.,Deaton Terrence F.,Hartojo Kristianto,Strayer Roy E.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Neutron Induced Single Event Testing of Commercial Ferroelectric Memory Device (FRAM);2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC);2023-07