Author:
Szabo Carl M.,Duncan Adam,LaBel Kenneth A.,Kay Matt,Bruner Pat,Krzesniak Mike,Dong Lei
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Machine Learning Approaches for Analysis of Total Ionizing Dose in Microelectronics;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03
2. Total Ionizing Dose Effects ofn-FinFET Transistor in iN14 Technology;2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC);2021-07
3. Radiation Specification and Testing of Heterogenous Microprocessor SOCs;2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2019-09