Author:
Wang Wenping,Balakrishnan Varsha,Bo Yang ,Yu Cao
Cited by
6 articles.
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1. Reducing Power Dissipation in Memory Repair for High Fault Rates;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-12
2. Iterative Diagnosis Approach for ECC-Based Memory Repair;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-02
3. Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS;IEEE Transactions on Computers;2016-07-01
4. TM-RF: Aging-Aware Power-Efficient Register File Design for Modern Microprocessors;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2015-07
5. The Impact of BTI Variations on Timing in Digital Logic Circuits;IEEE Transactions on Device and Materials Reliability;2013-03