DefectNet: Toward Fast and Effective Defect Detection
Author:
Affiliation:
1. School of Computer Science and Technology, Donghua University, Shanghai, China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx7/19/9259274/09381247.pdf?arnumber=9381247
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