Author:
Gao Zhan,Hu Min-Chun,Swenton Joe,Malagi Santosh,Huisken Jos,Goossens Kees,Marinissen Erik Jan
Cited by
7 articles.
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1. Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift;Journal of Electronic Testing;2023-04
2. Cell-Aware Model Generation Using Machine Learning;Frontiers of Quality Electronic Design (QED);2023
3. A comparative overview of ATPG flows targeting traditional and cell-aware fault models;2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS);2022-10-24
4. Recent Trends and Perspectives on Defect-Oriented Testing;2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS);2022-09-12
5. A Comprehensive Learning-Based Flow for Cell-Aware Model Generation;2022 IEEE International Test Conference (ITC);2022-09