Design of Electronic Devices Stress Testing System with Charging Line Based Impulse Generator

Author:

Kirichenko M.V.1,Drozdov A.N.1,Zaitsev R.V.1,Khrypunov G.S.1,Drozdova A.A.1,Zaitseva L.V.1

Affiliation:

1. National Technical University “Kharkiv Polytechnic Institute”,Materials for Electronics and Solar Cells Department,Kharkiv,Ukraine

Publisher

IEEE

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Control and cooling of the electronic load solution based on FET-transistor;2022 IEEE 8th International Conference on Energy Smart Systems (ESS);2022-10-12

2. Thermal-Powerloss Approximation Method for Determination of Efficiency in Semiconductor Devices;2022 IEEE 41st International Conference on Electronics and Nanotechnology (ELNANO);2022-10-10

3. Reduction of Granular Material Losses in a Vortex Chamber Supercharger Drainage Channel;Lecture Notes in Mechanical Engineering;2022

4. Analysis of Exact and Approximating Dependences of the Active Resistance of Conductor on the Frequency of Current Under the Action of Skin Effect;IEEE EUROCON 2021 - 19th International Conference on Smart Technologies;2021-07-06

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