Investigation of FPGA and SRAM Cells Under Radiation Exposure-Reference-Cited by-同舟云学术

Investigation of FPGA and SRAM Cells Under Radiation Exposure

Published:2022-04-25 Issue: Volume: Page:
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Container-title:2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
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Author:

Weide-Zaage Kirsten¹,Paya-Vaya Guillermo²,Schmidt Katharina³,Hagenah Dorian³

Affiliation:

1. RESRI Group, Institute of Microelectronic Systems (IMS), Leibniz Universität Hannover,Hannover,Germany

2. Chair for Chip Design for Embedded Computing, Technische Universität Braunschweig,Germany

3. Bundeswehr Research Institute for Protective Technologies and NBC Protection (WIS),Munster,Germany

Publisher

IEEE

Link

Reference9 articles.

2. On the Critical of Caches in Fault-Tolerant Processors for Space;di mascio;IEEE,2019

3. Techniques for radiation effects mitigation in ASICs and FPGAs handbook;CSS-Q-HB-60-02A,2016

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2. A Probability Soft-Error Model for a 28-nm SRAM-based FPGA under Neutron Radiation Exposure;2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2023-04-17