Fault Ride-Through Improvement of DFIG-WT by Integrating a Two-Degrees-of-Freedom Internal Model Control-Reference-Cited by-同舟云学术

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Fault Ride-Through Improvement of DFIG-WT by Integrating a Two-Degrees-of-Freedom Internal Model Control

Published:2013-03 Issue:3 Volume:60 Page:1133-1145
ISSN:0278-0046
Container-title:IEEE Transactions on Industrial Electronics
language:
Short-container-title:IEEE Trans. Ind. Electron.

Author:

Campos-Gaona David,Moreno-Goytia Edgar L.,Anaya-Lara Olimpo

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx5/41/6331663/06290361.pdf?arnumber=6290361

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