Electric field effect on metallic particle contamination in a common enclosure gas insulated busduct-Reference-Cited by-同舟云学术

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Electric field effect on metallic particle contamination in a common enclosure gas insulated busduct

Published:2007-04 Issue:2 Volume:14 Page:334-340
ISSN:1070-9878
Container-title:IEEE Transactions on Dielectrics and Electrical Insulation
language:
Short-container-title:IEEE Trans. Dielect. Electr. Insul.

Author:

Nagesh Kumar G.V.,Srivastava K.D.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/94/4150588/04150599.pdf?arnumber=4150599

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2. Modelling on thermal‐fluid field in SF ₆ insulated high voltage direct current bushing with its influence on electric field distribution and metal particle motion;High Voltage;2022-07-14

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