The VAMAS intercomparison on the upper critical field measurement in Nb-Ti wire
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Published:1995-06
Issue:2
Volume:5
Page:536-539
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ISSN:1051-8223
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Container-title:IEEE Transactions on Appiled Superconductivity
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language:
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Short-container-title:IEEE Trans. Appl. Supercond.
Author:
Tachikawa K.,Koyama S.,Takahashi S.,Itoh K.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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