Identifying the Loss Components Contributing to the Series Resistance of Shielded On-Chip Coplanar Waveguide Interconnects-Reference-Cited by-同舟云学术

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Identifying the Loss Components Contributing to the Series Resistance of Shielded On-Chip Coplanar Waveguide Interconnects

Published:2019-06 Issue:6 Volume:67 Page:2208-2215
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Mendez-Jeronimo Gabriela^ORCID,Torres-Torres Reydezel^ORCID

Funder

CONACyT-Mexico

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/8730445/08693688.pdf?arnumber=8693688

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An Overview of RF and Microwave Research in Latin America: Scanning Latin American Research on Microwaves;IEEE Microwave Magazine;2023-05

2. The Use of Coplanar Transmission Lines for Protecting Receiving Antenna Systems from Powerful Electromagnetic Radiation in a Wide Frequency Range;Problems of the Regional Energetics;2023-02

3. Optimization of On-Chip Meander Line Resistor by Using DOE Method;IETE Journal of Research;2022-01-17

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