Reliability Investigation of Photoconductive Continuous-Wave Terahertz Emitters-Reference-Cited by-同舟云学术

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Reliability Investigation of Photoconductive Continuous-Wave Terahertz Emitters

Published:2011-08 Issue:8 Volume:59 Page:2001-2007
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Gobel Thorsten¹,Schoenherr Daniel²,Sydlo Cezary³,Feiginov Michael³,Meissner Peter³,Hartnagel Hans Ludwig²

Affiliation:

1. Photonic Components Department of the Fraunhofer Institute of Telecommunications, Heinrich Hertz Institut, Berlin, Germany

2. Microwave Electronics Department, Technische Universität Darmstadt, Darmstadt, Germany

3. Optical Communications Department, Technische Universität Darmstadt, Darmstadt, Germany

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx5/22/5983338/05783955.pdf?arnumber=5783955

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2. Photoconductive Antennas for Terahertz Applications;Photoconductivity and Photoconductive Materials;2022-06-17

3. Analysis of Screening Effects on Terahertz Photoconductive Devices Using a Fully-Coupled Multiphysics Approach;Journal of Lightwave Technology;2021-12-15

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