On-Wafer Measurement Errors Due to Unwanted Radiations on High-Q Inductors-Reference-Cited by-同舟云学术

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On-Wafer Measurement Errors Due to Unwanted Radiations on High-Q Inductors

Published:2016-09 Issue:9 Volume:64 Page:2905-2911
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Bushueva Olga,Viallon Christophe^ORCID,Ghannam Ayad,Parra Thierry

Funder

Région Midi-Pyrénées Project Millitechno3D

LAAS-CNRS micro and nano technologies platform member of the French RENATECH network

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/7558254/07536628.pdf?arnumber=7536628

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. High $Q$ Coil Measurement for Inductive Power Transfer;IEEE Transactions on Microwave Theory and Techniques;2019-05

3. Characterization of High-$Q$ Inductors Up to its Self-Resonance Frequency for Wireless Power Transfer Applications;IEEE Microwave and Wireless Components Letters;2018-12

4. High-Performance Compact 3-D Solenoids for RF Applications;IEEE Microwave and Wireless Components Letters;2018-06

5. Ultra-Compact, High-Performance, 3D-IPD Integrated Using Conformal 3D Interconnects;2018 IEEE 68th Electronic Components and Technology Conference (ECTC);2018-05

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